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Joint Research Activities

Joint Research Activities( JRA )

All the JRA's are meant to enhance the potential and the attractiveness of the TA: JRA1-3 through scientific enhancement, JRA4-5 through technological improvements. Equally, the wide range of different needs of visitors within the TA will sharpen the definitions and fine tune the objectives of the different JRA's.


JRA1:3D imaging of nanoclusters

Activity Leader
Dr. Paul Midgley
Reader in Electron Microscopy
Department of Materials Science and Metallurgy
University of Cambridge
Pembroke Street
GB-CB2 3QZ CAMBRIDGE
UNITED KINGDOM
Phone + 44 1223 334 561
Fax + 44 1223 334 563
E-mail: pam33@cam.ac.uk
Website: www.cam.ac.uk

This research activity focuses on the combination of electron tomography with high resolution TEM, high angle annular dark field STEM, or energy filtered TEM, and thus creates an extremely powerful synergy of methods. Through electron tomography three dimensional local information will be available, down to sub nanometer scale. This technique will be applied to nanoparticle research.

JRA2: Electronic structure mapping

Activity Leader
Prof. Dr. Christian Colliex
Université Paris Sud
Laboratoire de Physique des solides
FR-91405 Orsay FRANCE
Phone + 33 169 155 370
Fax + 33 169 158 004
E-mail : colliex@lps.u-psud.fr
Web site: www.lps.u-psud.fr/Collectif/gr_27/

This JRA will push the capabilities of new techniques of electron state and chemical mapping as far as possible to the physical limit in a variety of materials science problems. Seven tasks were selected concerning different types of objects and properties. The general objective is to identify the best strategy to perform quantitative and reliable measurements and to extract from them the key physical or chemical information. All these tasks will therefore incorporate selection of the most efficient instrumentation and methods, support of theoretical modeling and estimation of the sensitivity.

JRA3: Mapping (nano)fields

Activity Leader
PProf. Dr. Hannes Lichte
Institute of Structure Physics
Triebenberg Laboratory
Technische Universität Dresden
DE-01062 DRESDEN
GERMANY
Phone + 49 351 2150 8910
Fax + 49 351 2150 8920
E-mail: Hannes.Lichte@Triebenberg.de
Web site: www.Triebenberg.de

This activity focuses on electron holography as an excellent method for quantitative analysis of electronic and magnetic (nano) fields from the microscopic scale down to the atomic scale. It reveals the whole electron object wave including amplitude and phase. It is an excellent technique for the characterization of nanofields in some of the nanostructured materials.

JRA4: Detectors

Activity Leader
Prof. Dr. Angus Kirkland
Department of Materials
University of Oxford
16 Parks Road
GB-OX1 3PH OXFORD
UNITED KINGDOM
Phone + 44 1865 273 662
Fax + 44 1865 283 333
E-mail: angus.kirkland@materials.oxford.ac.uk
Website: www-em.materials.ox.ac.uk/

This activity is aimed at overcoming the current need for improved detection in electron microscopy. The first project aims to upgrade a former developed device to provide increased sensitivity of the detector chain. It incorporates a back-thinned CCD for improved resolution and sensitivity. The second project involves the development of a new detector that will directly detect the incident electrons. The active portion of the new detector is related to silicon strip detectors, fabricated on a thin membrane of silicon with a pitch between the strips of only 10-20mm.

JRA5: Lab in the microscope

Activity Leader
Prof. Dr. Henny Zandbergen
Fac. Of Applied Sciences
Kavli Inst. Nat.
Lorentzweg 1
NL-2628 CJ DELFT
NEDERLAND
Phone + 31 152 782 266
Fax + 31 152 786 730
E-mail: H.W.Zandbergen@tnw.tudelft.nl
Website: http://nchrem.tnw.tudelft.nl/

This research activity focuses on the development of an in-situ laboratory that allows to experiment in the microscope. The objectives of this activity are a) to develop a number of sample holders (based on the needs of the ESTEEM partners) to allow advanced in-situ experiments, b) to make available to the partners and the users of the facilities the developed specimen holders and their manufacturing expertise. A higher control of the experiments should lean to developing standards in this field helping translating results into materials improvement, and making in-situ electron microscopy also more accessible for small companies.